XVIII Conference on Resistive Plate Chambers and Related Detectors

Dynamic Multiscale Simulation of Avalanche-Induced Field Perturbations in RPC Detectors

Not scheduled

20m

Talk Physics and Simulation

Speaker

Victor Olenin Ramirez Beltran (Universidad Iberoamericana)

Description

Resistive Plate Chambers (RPCs) are commonly simulated using a multiscale approach in which Geant4 describes particle transport and energy deposition, while Garfield++ models gas ionization and avalanche development. In most existing workflows, these two frameworks are coupled sequentially: Geant4 outputs are exported and subsequently processed by Garfield++, preventing microscopic ava- lanche information from influencing the ongoing detector simulation.
In this contribution, we present a dynamic Geant4–Garfield++ interface designed to enable event- by-event microscopic feedback during detector operation. Whenever a charged particle traverses the gas gap, the simulation is temporarily transferred from Geant4 to Garfield++, where primary ionization, avalanche growth, and charge production are evaluated. The resulting avalanche charge is then used to estimate local perturbations of the electric field and an effective local voltage drop within the gas volume. This information is returned to Geant4, allowing the detector state to be updated before the simulation proceeds.
The proposed framework introduces a self-consistent multiscale description in which microscopic avalanche dynamics can modify macroscopic detector conditions during the same event. This enables the reconstruction of new observables that are generally inaccessible in conventional offline coupling schemes, including local voltage-drop distributions, effective field distributions, and event-by-event field perturbations associated with avalanche development.
The methodology is particularly relevant for studies under GIF++-like irradiation conditions, whe- re the interplay between muons, gamma background, and local field distortions may influence detector performance. Rather than treating the electric field as a static quantity, the framework allows it to evolve according to microscopic charge production, providing a new route toward dynamic RPC simu- lations and future investigations of detector response, rate effects, and operational stability.