Speakers
Description
Integrated Circuits(ICs) are widely used in satellites and aircraft. High energetic particles in the environment such as protons, electrons, and heavy ions will hit these devices causing Single Event Effect(SEE). The probability of the occurrence of SEE and the single event sensitive map of the devices are very concerned by researchers. To improve the efficiency and accuracy of SEE studies, a micrometer-scale positioning device for testing SEE in integrated circuits, named Hi’Beam-SEE, has been developed. The device can be used at the Heavy Ion Research Facility in Lanzhou (HIRFL) and the High-Intensity Heavy-ion Accelerator Facility (HIAF), which can accurately give the distribution of SEE sensitive map of the ICs. The Hi’Beam-SEE system consists of three main components: the heavy ion positioning system is responsible for locating the trajectory of each particle in the beam, the single events detection system is responsible for detecting single event effects that occurred in the device under test, and the GPU-based online data processing is responsible for beam reconstructing and locating the final sensitive map. The prototype of Hi’beam-SEE has been designed. The laser and beam test of the heavy ion positioning system has been carried out, and an excellent spatial resolution has been achieved. A single events detection system has been designed. Data processing algorithms enable detection rates of 110+ fps when processing a single image containing 25+ laser or heavy-ion trajectories.
| Minioral | Yes |
|---|---|
| IEEE Member | No |
| Are you a student? | Yes |
