25–29 May 2026
La Biodola - Isola d'Elba (Italy)
Europe/Rome timezone
NB: The submission deadline for the Student Paper Awards is Monday, 11 May.

100 Temperature-Induced Delay Drift in Xilinx FPGA Multi-gigabit Transceivers

27 May 2026, 10:36
2m
Maria Luisa Room (Hotel Hermitage)

Maria Luisa Room

Hotel Hermitage

Mini Oral Real Time Diagnostics, Digital Twin, Control, Monitoring, Safety and Security Mini Orals

Speaker

Yonggang Wang (University of Science and Technology of China)

Description

In large-scale physical experiments, the multigigabit transceivers (MGTs) in field-programmable gate arrays (FPGAs) have become a prevalent choice to implement high-precision clock distribution and synchronization. However, the temperature-induced delay drift in MGTs and other electronic components has not been well investigated, posing a significant challenge to synchronization stability at picosecond levels. This paper first characterizes the temperature coefficients of MGTs in Xilinx Kintex UltraScale+ FPGA and then implements temperature compensation in a clock distribution and synchronization system to demonstrate performance enhancement. Utilizing an on-chip, temperature-robust Dual-Mixer Time Difference (DDMTD) method, the temperature coefficients in the transmitter (TX) and receiver (RX) are measured as 1.42 ps/°C and 0.59 ps/°C respectively. After applying compensation, within a temperature range from 35°C to 80°C, the maximum drift of the clock distribution is reduced from 90.7 ps to 7.6 ps. The significant temperature effect in the TX is theoretically analyzed at the end of this paper.

Minioral Yes
IEEE Member No
Are you a student? Yes

Authors

Ruiyang Wang (University of Science and Technology of China) Lingyun Li (University of Science and Technology of China) Yonggang Wang (University of Science and Technology of China)

Presentation materials