29 September 2026 to 3 October 2026
Oxford University, Physics Department
Europe/London timezone

Beam-Beam Simulation Models and Numerical Noises for Flat Beam Collisions in the Electron-Ion Collider

30 Sept 2026, 16:41
3m
Denys Wilkinson Building, Dennis Sciama Lecture Theatre (Oxford University, Physics Department)

Denys Wilkinson Building, Dennis Sciama Lecture Theatre

Oxford University, Physics Department

Keble Road, Oxford OX1 3RH
Poster Contributions (and Flash Talks) P

Speakers

Yun Luo (Brookhaven National Laboratory) Yun Luo (Brookhaven National Laboratory)

Description

The Electron-Ion Collider (EIC), to be built at Brookhaven National Laboratory will collide polarized high energy electron beams with polarized protons and light ions with maximum peak luminosity up to $1\times10^{34}$cm$^{-2}$s$^{-1}$ in center mass energy range of 20-140 GeV. Both strong-strong and weak-strong models are used for the beam-beam interaction simulation studies for the EIC. For the strong-strong model, particle-in-cell (PIC) based Poisson solver is used to numerically calculate the beam-beam force. We observed a much larger proton emittance growth rate than in weak-strong simulation. To understand the numerical noise and its impact on the physics results, we carried our extensive studies to identify all possible causes for artificial emittance growth and quantify their contributions. In this article, we present our study activities and findings. This work will help us better understand the simulated emittance growth and the limits of the PIC based strong-strong beam-beam simulation.

Authors

Yun Luo (Brookhaven National Laboratory) Yun Luo (Brookhaven National Laboratory)

Co-authors

Presentation materials

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