Speaker
Description
The Very Large Area gamma-ray Space Telescope-Pathfinder (VLAST-P) operates in a low-Earth orbit at an altitude of approximately 500 km, where exposure to space radiation poses reliability challenges for its readout electronics. Accordingly, radiation-induced single-event effects (SEE) and total ionizing dose (TID) degradation require systematic evaluation.To address this, a ground-based heavy-ion irradiation test system was developed for SEE and TID assessment of the VLAST-P calorimeter readout electronics. The FPGA-based system adopts a radiation-decoupled modular architecture, enabling real-time SEE detection and protection as well as quantitative evaluation of TID-induced performance degradation. An adaptive characterization method for SEL recovery, combined with a global timestamp mechanism, is implemented to support quantitative recovery analysis.Heavy-ion irradiation results show that no SEL events were observed in either the mixed-signal AD9266 or the analog THS4524, while 45 SEU events were recorded in the AD9266. TID testing up to 10 krad resulted in increased noise of the THS4524 from 75.6 to 94.7 mV and a DNL increase of the AD9266 from 0.25 to 0.27 LSB.
| Minioral | Yes |
|---|---|
| IEEE Member | No |
| Are you a student? | Yes |