Speaker
Description
The development of high brightness RF photoinjectors for advanced accelerator applications necessitates a precise understanding of the initial beam distribution and physical parameters of the electron source. Traditional analysis of the solenoid scan technique fits the measured transverse spot sizes of the electron beam with a simplified analytic model to characterize the phase space at the exit of the RF gun. In this work, we demonstrate how combining a simulation-based beamline model with Markov Chain Monte Carlo (MCMC) techniques extends our understanding of photoinjector performance. By applying this Bayesian approach to experimental solenoid scan data, we recover posterior probability distributions for unmeasured or difficult-to-measure parameters, such as the photocathode Mean Transverse Energy (MTE) and the cathode longitudinal position within the re-entrant RF gun cavity. Importantly, the analysis reveals the multidimensional correlations and degeneracies between parameters, providing a deeper physical understanding of the coupled dynamics required to optimally characterize and control advanced high-brightness photoinjectors.
| Working group | WG5 |
|---|