21–23 May 2018
Topland | Hotel & Convention Center Phitsanulok
Asia/Bangkok timezone

A Study of Silicon Wafer with SRP Technique

22 May 2018, 13:30
15m
Sukhothai Room

Sukhothai Room

Oral High Energy and Particle Physics A12: High Energy Physics

Speaker

Mr Sakdinan Naeosuphap (Suranaree University of Technology)

Description

Silicon sensors are used for particle tracking in many high energy physics (HEP) experiments. Suranaree University of Technology (SUT), Thai Micro Electronic Center (TMEC) and A Large Ion Collider Experiment (ALICE) collaborate to develop a new sensor for the Inner Tracking System (ITS). In this project, the new sensor is requested to be 50 microns thick to reduce its material budget. To achieve the required specifications, ultrathin silicon wafers with 25 microns thickness and high resistivity are used. We measure the doping concentration and epitaxial layer depth using Spreading Resistance Profiling (SRP) and Scanning Electron Microscope (SEM). Our results show that it is possible to obtain high resistivity wafers up to 1.6 kΩ∙cm with an epitaxial layer of 25 microns to be used as starting materials for the new ALICE PIxel DEtector (ALPIDE) sensor.

Author

Mr Sakdinan Naeosuphap (Suranaree University of Technology)

Co-authors

Dr Chinorat Kobdaj (Suranaree University of Technology) Dr Jirawat Prabket (Thai Microelectronics Center (TMEC))

Presentation materials

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