21–26 Jun 2026
University of California, Irvine
US/Pacific timezone

Robotic Testing System Automation for DUNE Cold-Electronics ASIC Quality Control

Not scheduled
20m
Conference Center (University of California, Irvine)

Conference Center

University of California, Irvine

Poster New Technologies for Neutrino Physics Poster session

Speaker

Natalie Tianai Ma (University of California, Irvine)

Description

The Deep Underground Neutrino Experiment (DUNE) is a flagship long-baseline neutrino oscillation experiment that will use large Liquid-Argon Time Projection Chambers (LArTPCs) to study neutrino properties. DUNE will deploy custom cold electronics for TPC readout, placing stringent requirements on long-term stability and pre-installation Quality Control (QC) of ASIC chips. Robotic Testing Systems (RTSs) have been developed to increase QC throughput and reduce operator dependence by automating chip handling and test execution. We report operational and software improvements that enable more robust end-to-end unattended runs of a RTS used for DUNE ASIC QC. The system combines a robotic arm with vacuum pickup, machine-vision–assisted alignment, and chip identification for automated handling and traceability. It coordinates pick-and-place between trays and test sockets, executes standardized tests of amplifier, digitizer, and transmitter ASIC chips, and records results. We implemented workflow and safety enhancements that improve reliability during routine operation, including controlled pause/resume behavior and recovery from common interruptions encountered during automated runs. In addition, we investigated and resolved a persistent position-specific pickup failure that previously required a mid-cycle manual intervention. By identifying the underlying tolerance-related cause and applying a targeted software-level correction, full test cycles can now complete without human intervention, improving overall efficiency and stability. These upgrades strengthen RTS-based DUNE cold-electronics QC by enabling more reliable unattended operation and supporting increased testing throughput as chip volumes grow.

Author

Natalie Tianai Ma (University of California, Irvine)

Co-authors

Alejandro Yankelevich (University of California, Irvine) Larry Zhao (University of California, Irvine)

Presentation materials