Speaker
Description
Transmission electron microscopy (TEM) grids have recently emerged as a powerful tool for single-shot 4D transverse emittance measurements on low-charge electron beams, with additional applications in generating microbunched beams through emittance exchange (EEX) for coherent radiation generation. However, their use has been largely confined to few-MeV beams, and the effects of bremsstrahlung background and scintillator point spread function on phase space reconstruction have received little systematic study. In light of this, we present a thorough Geant4 Monte Carlo study quantifying these noise contributions and their dependence on parameters such as grid-to-screen distance and grid pitch, applied across beams spanning a range of emittances to assess measurement fidelity. We further characterize the upper energy limit at which TEM grid-based emittance reconstruction remains reliable.
| Working group | WG5 |
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