Speaker
Description
We present simulation results on the generation of sub-micron longitudinal beam modulations using an emittance exchange (EEX) beamline. An initial transverse modulation is produced with a transmission electron microscope (TEM) grid and mapped into the longitudinal plane through an asymmetric EEX configuration, where different dogleg bending angles are employed to reduce CSR-induced distortions. While the asymmetric configuration mitigates CSR effects, nonlinear second-order effects significantly degrade the final phase space structure. To address this, we identify the dominant second-order contributions, analyze their evolution along the beamline, and implement sextupole-based mitigation to suppress these effects. The results demonstrate longitudinal bunch train with sub-micron modulation periods and a bunching factor of 0.6 at 1 pC.
| Working group | WG5 |
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