Speaker
Description
Tailoring the longitudinal current profile for relativistic electron beams is essential for improving the efficiency of beam-driven wakefield acceleration. While various methods exist, applications involving ultra-high-energy or extreme current require non-invasive diagnostics. Electro-Optic Sampling (EOS) has the potential to provide non-invasive, single-shot access to the current profile with femtosecond resolution, which makes it a promising candidate for such environments. However, its application to the accurate measurement of shaped electron beams for wakefield accelerators remains limited. In this work, we investigate a Phase-Diversity Electro-Optic Sampling (DEOS) approach for measuring shaped bunches generated by an Emittance Exchange (EEX) beamline. Progress in the development will be presented.
| Working group | WG5 |
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