IEEE NPSS School of Application of Radiation Instrumentation Dakar -Senegal

Complementary lecture #1 Statistics and Data Analysis

22 Nov 2022, 09:00

45m

Speaker

Christian Bohm (Stockholm University (SE))

Description

Some key concepts: Significance and increased statistics, Bayesian statistics, Look elseware effect, Aliasing

Presentation materials

Dakar_statistics_1pptx.pdf

Dakar_statistics_1pptx.pptx