Speaker
Description
With improvements in RF technology, as well as potential novel THz or plasma-based acceleration mechanisms, particle bunches have the potential to be compressed down to the 10 fs scale and below. To complement these advances and allow exploitation of these ultrashort beams, more precise longitudinal beam diagnostics are required.
Well-established electro-optic (EO) techniques offer non-destructive direct measurements of the longitudinal bunch profile and arrival time jitter. Until recently, however, EO methods suffered from a compromise between the power of the laser and the temporal resolution obtainable. Techniques such as temporally resolved detection or spectral upconversion require high power lasers due to second harmonic generation and/or frequency-resolved optical gratings (FROGs) necessary to the setup, whereas spectral encoding can use a far lower power laser but the time resolution is restricted by the window of time being observed.
We build on previously presented work showing EO Spectral Interferometry (EOSI) as a “plug and play” longitudinal profile monitor. This technique uses a common path Mach-Zender interferometer to extract extra information from the induced optical spectrum to reconstruct the Coulomb field of the electron bunch at the desired precision over an arbitrarily long observation window. This shifts the limit of the resolution from the time window to the range of optical frequencies present in the laser pulse, extending EO techniques towards the 10 fs regime.
We show results from EOSI experiments at the CLEAR linear accelerator at CERN, which is able to produce 200 MeV electron bunches down to 200 fs. This demonstration is extended to a profile monitor design for use on the AWAKE experiment at CERN, while also laying the groundwork to explore novel concepts and materials to push the limits of EO techniques further towards the 10 fs regime and below.
| Presenting Author | Samuel Norman |
|---|---|
| Is the Presenting Author a PhD Student or Early Career Scientist ? | Yes |
| Area of research | Instrumentation for accelerators |