Speaker
Roman Ciuryło
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Description
We explore applicability of several variations of pure frequency-based spectroscopic techniques to molecular systems and their metrology. In these techniques we take advantage from linear phenom-enon well-known as mode pushing in an optical cavity with an absorbing medium and intrinsic physical connection between absorption and dispersion. It was demonstrated that mode frequency shifts measurements allow to obtain molecular spectra with exceptional accuracy and precision.
Author
Roman Ciuryło
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Co-authors
Agata Cygan
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Katarzyna Bielska
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Dominik Charczun
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Grzegorz Kowzan
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Akiko Nishiyama
(National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology)
Piotr Wcisło
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Szymon Wójtewicz
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Mikołaj Zaborowski
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Piotr Masłowski
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Daniel Lisak
(Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń)
Adam J. Fleisher
(Chemical Sciences Division, National Institute of Standards and Technology)
Keith A. Gillis
(Sensor Science Division, National Institute of Standards and Technology)
Joseph T. Hodges
(Chemical Sciences Division, National Institute of Standards and Technology)
Thibault Voumard
(Deutsches Elektronen-Synchrotron DESY)
Thibault Wildi
(Deutsches Elektronen-Synchrotron DESY)
Tobias Herr
(Physics Department, Universität Hamburg UHH)
Victor Brasch
(CSEM - Swiss Center for Electronics and Microtechnology)
