9th Symposium on Frequency Standards and Metrology

Collapse Phenomenon in Phase Noise Curve of E5052B

Not scheduled

20m

Kingscliff, NSW, Australia

Invited Poster Precision and Low Noise Signal Generation and Techniques

Speaker

Xianhe Huang (University of Electronic Science and Technology of China)

Description

In the experiment of a 10MHz low phase noise crystal oscillator, a collapse phenomenon was ob-served in the phase noise curve when testing with Agilent E5052B. It was believed that this was caused by the instrument's background noise. The numerical relationship of this phenomenon was estimated, and a solution was proposed.

Presentation materials

Collapse Phenomenon in Phase Noise Curve of E5052B.pdf