1–5 Sept 2008
University of Glasgow
Europe/London timezone

TCT & test beam results of irradiated magnetic Czochralski silicon (MCz-Si) detectors

4 Sept 2008, 11:10
20m
University of Glasgow

University of Glasgow

Glasgow G12 8QQ UK
Oral Contribution Applications in Particle Physics Applications in Particle Physics

Speaker

Dr Panja-Riina Luukka (Helsinki Institute of Physics HIP)

Description

Pad and strip detectors processed on high resistivity n-type magnetic Czochralski silicon were irradiated to several different fluences with protons. The pad detectors were characterized with Transient Current Technique (TCT) and the full-size strip detectors with a reference beam telescope and 225 GeV muon beam. The TCT measurements indicate a double junction structure and space charge sign inversion in MCz-Si detectors after 5x10^14 neq/cm^2 fluence. In the beam test a S/N of 41 was measured for a non-irradiated MCz-Si sensor, S/N of 25 for a sensor irradiated with 1x10^14 1 MeV neq/cm^2, and a S/N of 19 for a sensor irradiated with 5x10^14 1 MeV neq/cm^2.

Author

Dr Panja-Riina Luukka (Helsinki Institute of Physics HIP)

Presentation materials