12–17 Jun 2016
University of Ottawa
America/Toronto timezone
Welcome to the 2016 CAP Congress! / Bienvenue au congrès de l'ACP 2016!

Integrated Testlets: Multiple-Choice Testing 2.0

16 Jun 2016, 09:00
30m
SITE C0136 (University of Ottawa)

SITE C0136

University of Ottawa

SITE Building, 800 King Edward Ave, Ottawa, ON
Invited Speaker / Conférencier invité Physics Education / Enseignement de la physique (DPE-DEP) R1-1 Interactive Teaching: Teaching with Technology (DPE) / Enseignement interactif et à l'aide de la technologie (DEP)

Speaker

Aaron Slepkov (Trent University)

Description

Multiple-choice (MC) exams are becoming more prevalent in physics courses as student populations rise and instructional resources dwindle. Particularly in STEM disciplines we would like to find ways to test deeper levels of understanding or knowledge integrations than are typically afforded by multiple-choice tests. With simple immediate-feedback tools we can construct new types of multiple-choice assessment structures that test both higher-level thinking, and knowledge integration. Such “Integrated Testlets” (ITs) also add the benefits of simple and valid granting of partial credit, as well as turning a final exam into a formative assessment opportunity. In this talk, I will touch on the antagonism between constructed-response and multiple-choice testing in physics, I will outline how ITs resolve some of this antagonism, I will summarize recent data on the validity of partial credit in MC testing, and I will briefly review the development and current usage of ITs.

Author

Aaron Slepkov (Trent University)

Co-author

Dr Ralph Shiell (Trent University)

Presentation materials