Speaker
Ansh Desai
(University of Oregon (US))
Description
The Skipper Charge Coupled Device (CCD), used by the SENSEI and DAMIC-M experiments, is currently the leading technology for detecting sub-GeV dark matter due to its single-electron sensitivity and low background rate. One of the main efforts of the SENSEI experiment has been to work on reducing single-electron backgrounds. One possible source of this background could arise from lattice defects in the silicon trapping and releasing charge on a timescale long enough to produce uncorrelated single-electron events. In this talk we present a characterization of charge-traps in the SENSEI detector and the impact of the observed population on the single-electron rate.
Author
Ansh Desai
(University of Oregon (US))