Speaker
Description
Using ultrafast spectroscopic ellipsometry, we aim to determine the transient dielectric function on a sub-picosecond timescale of organic and inorganic semiconducting thin films. We pick two thin film sample systems that differ in their electronic signature, namely bound excitons versus free Drude electrons: an organic semiconductor type consisting of solution-processed anilino squaraine dyes [1] and an inorganic transparent electrode consisting of sputter-coated indium tin oxide. [2] Transient pump-probe measurement techniques pose technical challenges when transferred to an ellipsometric setup [3] and place high demands on the samples.
[1] A. Minenkov, S. Hollweger, J. Duchoslav, O. Erdene-Ochir, M. Weise, E. Ermilova, A. Hertwig, M. Schiek. ACS Appl. Mater. Interfaces 16 (2024) 9517.
[2] R. Bernhardt, L. Rieland, T. Wang, M.F. Schumacher, A. Lützen, M. Schiek, P.H.M. Loosdrecht. Aggregate 6 (2025), e698.
[3] S. Richter, M. Rebarz, O. Herrfurth, S. Espinoza, R. Schmidt-Grund, J. Andreasson. Rev. Sci. Instrum. 92 (2021) 03104.