Speakers
Description
Investigations in fundamental science require advanced tools. In particular, the field of Nanoscience uses scanning electron and ion microscopes that allow imaging and patterning materials with resolution in the range of 1 nm [1, 2]. These microscopes are known as the Scanning Electron Microscope (SEM) and the Focused Ion Beam (FIB). Besides, Nanoscience studies often rely on the Atomic Force Microscope (AFM), which allows investigating the physical properties at the nanoscale of materials [3, 4] and of biomolecules [5, 6]. In this contribution, we will show how the set of these microscopes (SEM, FIB, AFM) can be smartly used to investigate fundamental aspects in Biology, Materials Science and Nanomagnetism. In particular, we will show examples where the SEM and FIB microscopes are used in combination with a precursor gas to grow nanotips at the apex of an AFM, techniques known as Focused Electron Beam Induced Deposition (FEBID) and Focused Ion Beam Induced Deposition (FIBID). These nanotips are subsequently applied to the investigation of the functional properties of magnetic thin films, nanopatterned structures, proteins and DNA.
References
[1] Nanofabrication, J. M. De Teresa (Ed.), IOP (U.K.) 2020, doi: 10.1088/978-0-7503-2608-7
[2] Höflich K. et al., Appl. Phys. Rev. 2023, 10, 041311
[3] Escalante-Quiceno T. et al., Low Temp. Phys. 2024, 50, 825
[4] Escalante-Quiceno T. et al., Sensors 2023, 23, 2879
[5] Allen F., De Teresa J. M., and Onoa B., ACS Appl. Mater. & Inter. 2024, 16, 4439
[6] Marcuello C. et al., manuscript under preparation