Speaker
Description
The isolation of graphene with its remarkable electronic, optical, mechanical and chemical properties has led to the emergence of a range of two-dimensional (2D) materials with unique properties. A variety of metallic, semiconducting and insulating 2D materials have been discovered and are being explored for a diverse range of applications. Many of these materials can be produced at high quality on the wafer scale by chemical vapour deposition on appropriate substrates. However, many of the envisaged applications (i.e. printed/flexible electronics, energy storage, photovoltaics, polymer composites, etc.) require single or few layer flakes of a 2D material that can be dispersed in solution to facilitate deposition onto a substrate, formulation of an ink and/or mixing into a composite. Powders and dispersions containing 2D material flakes are now becoming commercially available although material quality is highly variable, hindering the development of applications. This has highlighted the need for the development of standardized protocols for assessment of these materials.
In this presentation we will describe ongoing work at the NRC aimed at developing characterization methods and standard protocols to characterize powders, suspensions and inks containing 2D materials such as graphene, graphene oxide (GO) and transition metal dichalcogenides (TMDs). We employ a variety of experimental techniques including scanned probe microscopies (AFM and STM), vibrational spectroscopies (Raman and FTIR), X-ray diffraction, X-ray photoelectron spectroscopy and dynamic light scattering in order to characterize the structure and chemical composition of in-house and commercially available materials. Conductivity and work function of ultrathin films produced from various 2D material containing dispersions are also being measured.
| Keyword-1 | nanometrology |
|---|---|
| Keyword-2 | 2D materials |
| Keyword-3 | graphene |