22–28 Jun 2019
DoubleTree at the Entrance to Universal Orlando
America/New_York timezone

1P72 - Measurement of Diode Reverse Recovery Losses as a Function of Switching Frequency*

24 Jun 2019, 13:00
1h 30m
Universal Center

Universal Center

Poster 10.2 Components, magnetics, switches, capacitors Posters Fundamental Research and Basic Processes and Power Electronics

Speaker

Mr Christopher Martinez (University of Texas at Arlington)

Description

In compact pulsed power applications, high voltage is often sourced by a DC to DC resonant converter that draws power from a manageable, lower voltage source. As the converter’s switching frequency is increased, the size of the magnetics decreases increasing overall power density. Despite its many advantages, increasing the frequency can increase the switching losses within the rectifying diodes and solid-state switches. The research presented is focused on the studying the reverse recovery losses associated with Silicon Carbide Schottky diodes used in a high voltage full-bridge rectifier at switching frequencies ranging from 10 kHz to 65 kHz. The testbed assembled to study the diodes will be presented along with the results collected to date.

Authors

David Wetz (University of Texas at Arlington) Mr Christopher Martinez (University of Texas at Arlington) Mr Jacob Sanchez (University of Texas at Arlington) Mr Brian McRee (University of Texas at Arlington) Mr David Dodson (University of Texas at Arlington)

Presentation materials

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