22–28 Jun 2019
DoubleTree at the Entrance to Universal Orlando
America/New_York timezone

4P65 - X-ray Spectroscopy and Total Yield Measurements on a Microsecond X-Pinch

27 Jun 2019, 16:00
1h 30m
Universal Center

Universal Center

Speaker

G.S. Jaar (Florida A&M University)

Description

Emission spectra from a microsecond x-pinch were studied in the soft x-ray region which give information about the radiating hot spot plasma. The spectra were collected using a flat crystal spectrometer from aluminum and molybdenum in a 2x25 µm wire x-pinch configuration. We present results that show aluminum reaching the hydrogen-like state and molybdenum reaching the neon-like charge state, from which relevant plasma parameters are determined. We also present the results of a load optimization study for an x-pinch driven by a 350-kA microsecond generator. A scan of the configuration space across material, thickness, and number of wires was performed to determine which parameter combination creates the best total x-ray yield for use in radiography and backlighting. The configuration assessment was conducted using x-ray imaging, Si photodiodes, and diamond radiation detectors.

Authors

G.S. Jaar (Florida A&M University) Dr R.K. Appartaim (Florida A&M University)

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