Skip to main content
22–28 Jun 2019
DoubleTree at the Entrance to Universal Orlando
America/New_York timezone

5P01 - High Speed Imaging of Polymer Bonded Explosives under Mechanical Stresses

28 Jun 2019, 13:30
1h 30m
DoubleTree at the Entrance to Universal Orlando

DoubleTree at the Entrance to Universal Orlando

5780 Major Blvd. Orlando, Florida, 32819, USA

Speaker

Ryan Lee (Texas Tech University)

Description

The impact of mechanical stresses on polymer bonded high explosives, HE, is investigated. High-Speed photography in the visible spectrum, VIS, as well mid-wave infrared (MWIR) of HE during small diameter drilling and controlled skidding is presented. Controlled drilling into the HE enables recording the size and temperature of shavings under varying feed and speeds. Even at very high drill speeds, the HE phase transition temperature of approx. 180 degree Celsius is rarely exceeded. The MWIR signals radiated are recorded with FLIR’s X6901sc High-speed MWIR camera, which uses InSb technology, with a wavelength range from 3.0 to 5.0 µm, and up to 1,004 fps at a resolution of 640 x 512 in the temperature range of interest. The physical shaving’s path and size of the HE is recorded with Phantom’s VEO710s high-speed camera at much higher frame rate of 7,400 fps at a resolution of 1280 x 800 in the VIS.
In the skidding case, the HE is pushed with measured force against a rotating surface with controlled roughness. The roughness of the impact area is determined by varying the type and surface density of distributed grit. While it is straightforward to observe the HE-grit interaction in the VIS by employing a glass or BK7 window as interface surface, the MWIR range poses a greater challenge as such glasses are opaque in the MWIR. Thus, for the temperature measurements the HE is skidded across a sapphire optical window. The window is chosen for its IR transparency up to 5.5 µm wavelengths and mechanical toughness. Thus, the grit size and distribution is recorded in the VIS, while the MWIR provides information on the HE-grit interface temperature, which in the extreme case, leads to full or partial detonation of the HE.

Author

Ryan Lee (Texas Tech University)

Co-authors

Austin Hewitt (Center for Pulsed Power and Power Electronics(P3E)) Raimi Clark (Texas Tech University) Tyler Buntin (Texas Tech University) David Barnett (Texas Tech University) James Dickens (Texas Tech University) W. A. Harrison (CNS Pantex) E. Tucker (CNS Pantex) Andreas Neuber (Texas Tech University) Prof. John Mankowski (Texas Tech University)

Presentation materials

There are no materials yet.