Conveners
Other applications: Other applications
- Dennis Herbert Wright
Description
Session dedidacted to GEANT4 developments.
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Maurício Pazianotto (Instituto Tecnológico de Aeronáutica), Miguel Antonio Cortes Giraldo (Depto. de Fis. Atom., Mole. y Nucl.-Universidad de Sevilla)25/04/2019, 16:40Other applicationsOral
In the last few decades, the development of aircraft with higher maximum cruising altitude and greater autonomy, as well as a significant increase of air traffic, has increased the problem of controlling the ionizing radiation dose level received by pilots, aircrew and aircraft electronics, and has begun to worry radioprotection and flight safety organizations. The study of the effects of...
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Jorge Lerendegui Marco (Universidad de Sevilla (ES))25/04/2019, 17:00Other applicationsOral
Monte Carlo (MC) simulations are a key tool to study the fundamental features of a neutron beam, such as the neutron flux or the γ-ray background, in the design and optimization of experimental facilities. Traditionally, the most widely used MC codes in this field had been MCNPX and FLUKA. However, the Geant4 toolkit has also become a competitive code for the transport of neutrons after the...
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Mostafa Jamalipour (University of Milano-Bicocca)25/04/2019, 17:20Other applicationsOral
A study has been carried out in order to see the feasibility of Nanodiamond Particles (NDP) application as a reflector for Cold Neutrons (CN), Very Cold Neutrons (VCN) and Ultra Cold Neutrons (UCN) in Geant4. NDP has a large scattering angle probability against VCN and UCN compared to the other materials due to their high optical potential. This unique feature makes this powder a prominent...
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Mrs Elisabet Galiana (LIP ULisboa USC)25/04/2019, 17:40Other applications
The study of environmental radiation is a challenging task. It is well known that natural gamma radiation may vary depending on the altitude, type of soil, building materials and even human presence. All these variables and uncertainties make it difficult to foresee the background radiation present at a specific region beforehand. In order to better understand the contributions of each...
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Hossein Rafikheiri (NSTRI)25/04/2019, 18:00Other applicationsOral
Depth profiling and morphological characterization of thin film is of critical importance to a wide variety of modern technologies. Back scattering spectroscopy using MeV ion beams is considered as a powerful method for depth profiling elements in the near surface layer of solids. Generally, this technique is a one-dimensional method and the roughness and inhomogeneity of the target often is...
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