Dr
Jozef Stefan Institute
Author in the following contributions
- Impact of Single and Multiple Trenches as Isolation Structures in TI-LGADs: A Study on Charge Collection and Resistivity of IP region as seen by the fs-laser based TCT
- Investigating the Impact of Isolation Structure Configurations on the Charge Carrier Excess in the Inter-Pad Region within Low and High-Injection Carrier Dynamics: Comparative study of LGADs with 2 p-stops and Bias ring in IP Region vs. Configuration with Two Trenches
