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10–13 Sept 2023
Europe/Warsaw timezone

A special chamber for testing electromagnetic emissions in the near field zone

13 Sept 2023, 09:50
20m
Presentation at the conference Industrial applications Industrial Applications

Speaker

Krzysztof Trzcinka (Łukasiewicz Research Network - Industrial Research Institute for Automation & Measurements PIAP)

Description

This article describes the construction of a test stand for locating disturbance sources using an EMC scanner placed in a dedicated EMC test chamber. In the description of the construction of the stand, special attention was paid to the EMC test chamber and the solutions used for shielding and minimizing reflections of electromagnetic waves inside the chamber. The research results presented in this article concern the influence of the chamber shield on the possibility of locating the source of disturbances. Mainly, the results obtained when only shielding materials were used in the chamber to eliminate background disturbances of the environment and when ferrite plates were additionally installed on the walls were compared. The obtained test results in the chamber with ferrite plates on the walls are satisfactory.

Authors

Krzysztof Trzcinka (Łukasiewicz Research Network - Industrial Research Institute for Automation & Measurements PIAP) Rafał Kłoda (Łukasiewicz Research Network - Industrial Research Institute for Automation & Measurements PIAP) Wiktor Pawlak (Łukasiewicz Research Network - Industrial Research Institute for Automation & Measurements PIAP)

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Paper