			Physics(Material="Oxide")
						{
						### Nox: SiO2 fixed trapped charge definition
						### Nox: fixed

						 	Charge(Conc=@OxchargeConc@)
						}

						Physics(MaterialInterface="Silicon/Oxide")
						{
						### Nint: 0.8 - 0.9 of Nox
					### it just uses Gaussian distribution for interface traps
				
    		  				### donor-like Si-SiO2 interface traps Gaussian, Ev+0.7eV,sigma= 70mEv 
					   	### acceptor-like Si-SiO2 interface traps Gaussian,[ Ec-0.4eV,0.4 of Nint; Ec-0.6eV, 0.6 of Nint], sigma = 70meV
						### 
					
							Traps((hNeutral Conc=@OxIntchargeConc@ Gaussian EnergyMid=0.70 EnergySig=0.07      fromValBand   eXsection=1e-15 hXsection=1e-15   ) 
							       (eNeutral Conc=@<0.4*@OxIntchargeConc@>@ Gaussian EnergyMid=0.40 EnergySig=0.07   fromCondBand  eXsection=1e-15 hXsection=1e-15   ) 
							       (eNeutral Conc=@<0.6*@OxIntchargeConc@>@ Gaussian EnergyMid=0.60 EnergySig=0.07   fromCondBand  eXsection=1e-15 hXsection=1e-15   )) 

				

						}


						TrappedCarDistrPlot {
								    ### plots the interface traps distribution vs. E at some 'typical' location near the Si/SiO2 interface
								    MaterialInterface="Silicon/Oxide" {(0.132 -260 )}
								    ### plots the silicon region traps


		    						    }
