Reliable Integrated Circuits for High Energy Physics Instrumentation
by
Library
HEPHY
Reliability is one of the key aspects in development of high energy physics instruments. With that respect a special focus is dedicated to Application Specific Integrated Circuits (ASIC), the essential components in radiation detection systems. They are responsible for multiple functions: readout of electrical signal from detectors, analog to digital conversion, data processing and data transfer. Furthermore, ASICs often accommodate the power conditioning system that needs to provide stable and low noise supply voltage for the detector readout circuits. These are complex systems planned to operate for several years in the installations, where replacement of components is an extremely expensive operation. Also, the operating conditions are severe since on top of wearout and aging, unavoidable in the normal operating conditions, the ASIC has to withstand the intense levels of ionizing radiation. In this talk certain device- and circuit-level reliability aspects will be highlighted, with emphasis on the 28nm CMOS technology node. This CMOS process is one of the key technology nodes listed in the roadmap of the European Committee for Future Accelerators and therefore currently on the agenda for many new developments. Next to radiation tolerance and noise, also other reliability issues important in IC system design will be discussed.